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Activity

2014

• COMPARISON OF X-RAY DIFFRACTION DATA OF SILICATES IN BOTH REFLECTION AND TRANSMISSION MODE WITH NOVEL AUTOMATIC SIX SAMPLE CAPILLARY STAGE.
  114 Mineralogy/Crystallography (Posters)
  Monday, 20 October 2014

  9:00 AM - 6:30 PM

  Exhibition Hall C

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Date Unknown

• RIETVELD ANALYSIS / WHOLE PATTERN FITTING METHOD FOR QUANTIFICATION OF CLAY COMPONENTS
  143 Mineralogy/Crystallography; Petrology; Volcanology (Posters)