2 Advances in Mineralogy: From Field Association to Phase Equilibria
Monday, 20 March 2006
8:00 AM - 12:00 PM
NEW CRYSTALLIZATION THERMOMETERS FOR ZIRCON, RUTILE AND SPHENE: CALIBRATIONS, DIFFUSION CONSIDERATIONS, AND APPLICATIONS
Paper number: 2-10
Program: THEME SESSIONS
Time: 10:20 AM – 11:00 AM
Authors
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L.A. HaydenRensselaer Polytechnic Institute, Troy, NY
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D.A. WarkRensselaer Polytechnic Institute, Troy, NY
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D.J. CherniakRensselaer Polytechnic Institute, Troy, NY
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J.B. ThomasRensselaer Polytechnic Institute, Troy, NY
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J.E. ManchesterRensselaer Polytechnic Institute, Troy, NY
Abstract
log(Tizcn) = 6.03 - 5080/T
log (Zrrut) = 7.36 - 4470/T
log(Zrsph) = 11.30 - 9615/T
(T is in Kelvins; Ti and Zr refer to the concentrations of these elements in ppmw; all calibrations are for a nominal pressure of 1 GPa). The Ti-in-zircon thermometer is insensitive to pressure; Zr in rutile shows minor sensitivity to pressure, and Zr in sphene decreases by a factor of ~6 in response to a pressure increase of 1 GPa. These thermometers can be implemented using available in situ analytical techniques (EMPA; LA-ICP/MS; SIMS); in general, however, LA-ICP/MS or SIMS is needed for zircons crystallized below ~ 850°C and sphenes below ~725°C. The EMPA can be used for Zr-in-rutile thermometry on crystals formed at temperatures as low as ~500°C. Preliminary diffusion data for Ti in zircon indicate a high closure temperature broadly consistent with existing diffusion data for other tetravalent ions. However, Zr in rutile is relatively fast-diffusing, raising the possibility of partial diffusive re-equilibration to temperatures below 600°C in some retrograde environments. Diffusion of Zr in sphene is intermediate between the other two, implying generally closed-system behavior. Applications and intercomparisons of the new thermometers will be made with reference to natural rocks ranging from glassy rhyolites to subduction-zone migmatites.