12 Application of Modern Techniques to Address Fundamental Problems in Planetary Geology
Thursday, 2 April 2009
1:00 PM - 5:00 PM
APPLICATION OF SYNCHROTRON X-RAY FLUORESCENCE TECHNIQUES TO DISCRIMINATE AND QUANTIFY IMPLANTED SOLAR WIND IN GENESIS COLLECTORS AND IN SITU APOLLO 16 AND 17 PLAGIOCLASE GRAINS
Paper number: 12-1
Program: Symposia Sessions
Time: 1:00 PM – 1:20 PM
Authors
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Yong ChoiUniversity of Chicago, Argonne, IL
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Peter J. EngUniversity of Chicago, Argonne, IL
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Stephen R. SuttonUniversity of Chicago, Argonne, IL
Abstract
Specifically, in the case of the Genesis samples, the reduced size and terrestrial contamination on the surface of the collector plates necessitated the development and optimization of an angle-resolved, grazing incidence x-ray fluorescence technique. Using this technique, the elemental depth distribution was obtained resulting in the determination of absolute solar wind elemental abundances for several transition metals. We describe this application and present the solar wind Fe, Cr and Mn abundance determinations.
In the case of implanted solar wind in individual lunar soil grains, the method is based on in situ abundance measurements via microbeam x-ray fluorescence in both the implantation zone and bulk grains using the synchrotron x-ray microprobe. We describe this application and present the relative abundances of the transition metals Cr, Mn, Fe and Ni in the solar wind implanted in individual Apollo16 and 17 plagioclase grains. We relate these measurements directly to those provided by the Genesis collectors.