T286 Accessory Minerals as Monitors of Magmatic Processes: New Ideas, Applications, and Pitfalls
Wednesday, 3 November 2010
1:30 PM - 5:30 PM
Mile High Ballroom 1CD
THE RECORD OF MAGMATIC VOLATILES IN ACCESSORY MINERALS
Paper number: T286-11
Program: Technical Sessions
Time: 4:10 PM – 4:25 PM
Authors
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Jed L. MosenfelderCalifornia Institute of Technology, Pasadena, CA
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George R. RossmanCalifornia Institute of Technology, Pasadena, CA
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John M. EilerCalifornia Institute of Technology, Pasadena, CA
Abstract
The technique most amenable to measuring that range of concentrations in small volumes of material is secondary ion mass spectrometry (SIMS). However, the ability to measure small amounts of volatiles in minerals both accurately and precisely is a recent development that requires adherence to strict sample preparation and analytical protocols, including the development of robust calibrations based on well characterized standards. We will review recent developments in said protocols, recent applications to magmatic systems on Earth and the Moon, and potential future applications.