11 Volcanic Systems and Sediment Dynamics

Monday, 4 April 2016
1:30 PM - 5:30 PM
Meeting Room 203 C

THE APPLICATION OF X-RAY FLUORESCENCE (XRF) TECHNOLOGY TO IMPROVE THE ANALYSIS OF GEOLOGICAL MATERIALS

Paper number: 11-6
Program: Technical Sessions
Time: 3:10 PM – 3:30 PM

Authors

Abstract

The elemental analysis of geological materials can typically be very challenging due to the wide elemental and analytical range possible. XRF techniques have traditionally been a popular technique to do so with low detection limits and analytical ranges from sodium (Na) to americium (Am). Depending on the analytical requirement geological analysis is often conducted with either wavelength dispersive (WD) or energy dispersive (ED) spectrometers which both have their unique advantages.

In this abstract an innovative way of doing elemental analysis will be discussed using a combined WD and ED spectrometer incorporating recently developed analytical software. This uses WD and ED technologies simultaneously to decrease measurement times or improve precision without compromising the analytical requirement.

The application of these new approaches will be discussed in the analysis of geological materials with specific attention to time savings to achieve a specified analytical requirement including typical requirements such as accuracy, repeatability and detection limits to name a few.

Geological Society of America Abstracts with Programs. Vol. 48, No. 4

doi: 10.1130/abs/2016CD-274795

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