Geological Society of America

T14 Synchrotron X-ray and Neutron Applications in Earth and Environmental Science

Sunday, 22 September 2024
8:00 AM - 12:00 PM
213B

IN SITU X-RAY AND IR PROBES RELEVANT TO EARTH AND ENVIRONMENTAL SCIENCES AT THE ADVANCED LIGHT SOURCE AT LAWRENCE BERKELEY LABORATORY

Paper number: T14-3
Program: Technical Sessions
Time: 8:20 AM – 8:35 AM

Authors

Martin Kunz Presenting Author
Lawrence Berkeley National Laboratory, Berkeley, CA
Dilworth Y. Parkinson
Lawrence Berkeley National Laboratory, Berkeley, CA
David A. Shapiro
Lawrence Berkeley National Laboratory, Berkeley, CA
Nobumichi Tamura
Lawrence Berkeley National Laboratory, Berkeley, CA
Quentin Williams
University of California Santa Cruz, Santa Cruz, CA
Katherine Armstrong
Lawrence Berkeley National Laboratory, Berkeley, CA
Harold Barnard
Lawrence Berkeley National Laboratory, Berkeley, CA
Hans A Bechtel
Lawrence Berkeley National Laboratory, Berkeley, CA
Samantha C. Couper
Universoty of Utah, Salt Lake City, UT
Bora Kalkan
Lawrence Berkeley National Laboratory, Berkeley, CA
Harrison Lisabeth
Lawrence Berkeley National Laboratory, Berkeley, CA
Alastair A MacDowell
Lawrence Berkeley National Laboratory, Berkeley, CA
Lowell Miyagi
Universoty of Utah, Salt Lake City, UT

Abstract

Access to synchrotron facilities has become an important aspect for many disciplines in experimental Earth and environmental science. This is especially important for studies that rely on probing samples in situ under natural conditions different from the ones found at the surface of the Earth. The Earth and environmental science program at the Advanced Light Source (ALS), Lawrence Berkeley National Laboratory, offers a variety of tools utilizing the infrared, soft- and hard X-ray spectrum that allow Earth scientists to probe Earth and environmental materials at variable conditions of pressure, stress, temperature, atmospheric composition, and humidity. These facilities are important tools for the user community in that they offer not only considerable capacity (e.g. diffraction and X-ray microscopy) but also complementary (IR spectroscopy, microtomography), and in some cases unique (Laue microdiffraction) instruments.

Geological Society of America Abstracts with Programs. Vol. 56, No. 5

doi: 10.1130/abs/2024AM-405095

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